01290oam 2200433zu 450 991014570360332120241212215715.09781509090501150909050997814244165541424416558(CKB)1000000000711031(SSID)ssj0000453875(PQKBManifestationID)12203638(PQKBTitleCode)TC0000453875(PQKBWorkID)10487912(PQKB)10319800(NjHacI)991000000000711031(EXLCZ)99100000000071103120160829d2007 uy engur|||||||||||txtccr2007 IEEE International Workshop on Memory Technology, Design and Testing (MTDT)[Place of publication not identified]I E E E20071 online resourceBibliographic Level Mode of Issuance: Monograph9781424416561 1424416566 Random access memoryRandom access memory.004.5PQKBPROCEEDING99101457036033212007 IEEE International Workshop on Memory Technology, Design and Testing (MTDT)2410547UNINA