01127nam 2200361 450 991014567920332120180302144823.01-5090-7765-0(CKB)1000000000711265(WaSeSS)IndRDA00093268(EXLCZ)99100000000071126520180302d2008 || |engur|||||||||||txtrdacontentcrdamediacrrdacarrier2008 14th IEEE International On-Line Testing Symposium 7-9 July 2008New York :IEEE,2008.1 online resource (306 pages)0-7695-3264-0 Electronic circuitsTestingCongressesOnline data processingCongressesElectronic circuit designCongressesElectronic circuitsTestingOnline data processingElectronic circuit designWaSeSSWaSeSSPROCEEDING99101456792033212008 14th IEEE International On-Line Testing Symposium2337576UNINA