00897nam0-22003011i-450-99000027700040332120001010000027700FED01000027700(Aleph)000027700FED0100002770020001010d--------km-y0itay50------baitay-------001yyProbability, random processes, and estimation theory for engineersBy Henry Stark, John W. Woods.Englewood CliffsPrentice-Hall1986XV,430 p., 24 cm519Stark,Henry<1938- >8025Woods,Henry W.ITUNINARICAUNIMARCBK99000027700040332104 030-19DIC 225DINCHDINCHProbability, random processes, and estimation theory for engineers119706UNINAING0102154oam 2200565zu 450 991014566860332120241212215725.097815090777931509077790(CKB)1000000000711221(SSID)ssj0000394149(PQKBManifestationID)12170501(PQKBTitleCode)TC0000394149(PQKBWorkID)10379386(PQKB)10930390(EXLCZ)99100000000071122120160829d2008 uy engtxtccrNDCS 2008 : IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : proceedings, 29-30 September 2008, Cambridge, Massachusetts[Place of publication not identified]IEEE Computer Society2008Bibliographic Level Mode of Issuance: Monograph9780769533797 0769533795 Nanoelectromechanical systemsDesignCongressesNanoelectromechanical systemsTestingCongressesNanoelectronicsDevicesCongressesNanoelectronicsTestingCongressesNanostructured materialsCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCNanoelectromechanical systemsDesignNanoelectromechanical systemsTestingNanoelectronicsDevicesNanoelectronicsTestingNanostructured materialsElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied Sciences621.381IEEE Computer Society Technical Council on Test Technology.IEEE Computer SocietyPQKBPROCEEDING9910145668603321NDCS 2008 : IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : proceedings, 29-30 September 2008, Cambridge, Massachusetts2384600UNINA