02099oam 2200541zu 450 991014566860332120210807003114.01-5090-7779-0(CKB)1000000000711221(SSID)ssj0000394149(PQKBManifestationID)12170501(PQKBTitleCode)TC0000394149(PQKBWorkID)10379386(PQKB)10930390(EXLCZ)99100000000071122120160829d2008 uy engtxtccrNDCS 2008 : IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : proceedings, 29-30 September 2008, Cambridge, Massachusetts[Place of publication not identified]IEEE Computer Society2008Bibliographic Level Mode of Issuance: Monograph0-7695-3379-5 Nanoelectromechanical systemsDesignCongressesNanoelectromechanical systemsTestingCongressesNanoelectronicsDevicesCongressesNanoelectronicsTestingCongressesNanostructured materialsCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCNanoelectromechanical systemsDesignNanoelectromechanical systemsTestingNanoelectronicsDevicesNanoelectronicsTestingNanostructured materialsElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied Sciences621.381IEEE Computer Society Technical Council on Test Technology.IEEE Computer SocietyPQKBPROCEEDING9910145668603321NDCS 2008 : IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : proceedings, 29-30 September 2008, Cambridge, Massachusetts2384600UNINA