02072oam 2200529zu 450 991014564720332120241212215426.097815090954831509095489(CKB)1000000000278241(SSID)ssj0000394148(PQKBManifestationID)12102347(PQKBTitleCode)TC0000394148(PQKBWorkID)10386669(PQKB)10519948(EXLCZ)99100000000027824120160829d2006 uy engtxtccr2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings[Place of publication not identified]Institute of Electrical and Electronics Engineers2006Bibliographic Level Mode of Issuance: Monograph9780780397262 0780397266 Integrated circuitsDesign and constructionCongressesIntegrated circuitsTestingCongressesNanotechnologyDesignCongressesMicroelectronicsCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsDesign and constructionIntegrated circuitsTestingNanotechnologyDesignMicroelectronicsElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied SciencesGirard PatrickInternational Conference on Design & Test of Integrated Systems in Nanoscale Technology.PQKBPROCEEDING99101456472033212006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings2506700UNINA