01131nas 2200385- 450 991022006950332120241204164925.02477-6416(OCoLC)1014222475(CKB)4100000000504415(CONSER)--2018247588(EXLCZ)99410000000050441520171108a201u9999 --- -indur|n|||||||||txtrdacontentcrdamediacrrdacarrierIndonesian journal of applied physics[Surakarta, Indonesia] :Department of Physics, Sebelas Maret University1 online resourceRefereed/Peer-reviewed2089-0133 IJAPIndones. j. appl. physicsPhysicsPeriodicalsPhysicsfast(OCoLC)fst01063025Periodicals.fastPhysicsPhysics.Universitas Sebelas Maret.Jurusan Fisika,JOURNAL9910220069503321Indonesian journal of applied physics2575463UNINA02072oam 2200529zu 450 991014564720332120241212215426.097815090954831509095489(CKB)1000000000278241(SSID)ssj0000394148(PQKBManifestationID)12102347(PQKBTitleCode)TC0000394148(PQKBWorkID)10386669(PQKB)10519948(EXLCZ)99100000000027824120160829d2006 uy engtxtccr2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings[Place of publication not identified]Institute of Electrical and Electronics Engineers2006Bibliographic Level Mode of Issuance: Monograph9780780397262 0780397266 Integrated circuitsDesign and constructionCongressesIntegrated circuitsTestingCongressesNanotechnologyDesignCongressesMicroelectronicsCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsDesign and constructionIntegrated circuitsTestingNanotechnologyDesignMicroelectronicsElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied SciencesGirard PatrickInternational Conference on Design & Test of Integrated Systems in Nanoscale Technology.PQKBPROCEEDING99101456472033212006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings2506700UNINA