01347oam 2200409zu 450 991014562590332120210806235942.01-5090-9294-3(CKB)1000000000278334(SSID)ssj0000454307(PQKBManifestationID)12173435(PQKBTitleCode)TC0000454307(PQKBWorkID)10397793(PQKB)10469411(NjHacI)991000000000278334(EXLCZ)99100000000027833420160829d2006 uy engur|||||||||||txtccr2006 IEEE International Conference on Microelectronic Test Structures[Place of publication not identified]I E E E20061 online resource (xiii, 229 pages) illustrationsBibliographic Level Mode of Issuance: Monograph1-4244-0167-4 Electronic apparatus and appliancesTestingCongressesSemiconductorsTestingCongressesElectronic apparatus and appliancesTestingSemiconductorsTesting621.3810287PQKBPROCEEDING99101456259033212006 IEEE International Conference on Microelectronic Test Structures2529740UNINA