01884oam 2200505zu 450 991014561800332120241212215418.097815090982931509098291(CKB)1000000000278107(SSID)ssj0000395447(PQKBManifestationID)12164241(PQKBTitleCode)TC0000395447(PQKBWorkID)10454136(PQKB)11178292(EXLCZ)99100000000027810720160829d2006 uy engtxtccr2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings[Place of publication not identified]IEEE Computer Society2006Bibliographic Level Mode of Issuance: Monograph9780769525723 0769525725 Semiconductor storage devicesTestingCongressesRandom access memoryCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSemiconductor storage devicesTestingRandom access memoryElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/732IEEE Computer Society Technical Council on Test Technology.IEEE Computer Society Technical Committee on VLSI,IEEE International Workshop on Memory Technology, Design, and TestingPQKBPROCEEDING99101456180033212006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings2316454UNINA