02869oam 2200457zu 450 991014545350332120241212215415.097815090982861509098283(CKB)1000000000278061(SSID)ssj0000451820(PQKBManifestationID)12211420(PQKBTitleCode)TC0000451820(PQKBWorkID)10464032(PQKB)11082852(NjHacI)991000000000278061(EXLCZ)99100000000027806120160829d2006 uy engur|||||||||||txtccr24th IEEE VLSI Test Symposium (VTS 2006): 30 April - 04 May 2006/Berkeley, California[Place of publication not identified]IEEE Computer Society Press20061 online resourceBibliographic Level Mode of Issuance: Monograph9780769525143 0769525148 Proceedings. 24th IEEE VLSI Test Symposium -- 24th IEEE VLSI Test Symposium - Title -- 24th IEEE VLSI Test Symposium - Copyright -- 24th IEEE Symposium on Reliable Distributed Systems - Table of contents -- Forward -- Organizing Committee -- Program Committee -- Reviewers -- Acknowledgments -- Test Technology Technical Council (TTTC) -- Awards -- Test Technology Educational Progam (TTEP) Tutorials -- The impacts of untestable defects on transition fault testing -- Low-cost scan-based delay testing of latch-based circuits with time borrowing -- Path delay fault simulation on large industrial designs -- A scheme for on-chip timing characterization -- BIST for network-on-chip interconnect infrastructures.Annotation VTS 2006 focuses on innovation in the field of testing of integrated circuits and systems. VTS looks at the many trends and challenges in the semiconductor design and manufacturing industries with papers covering wide range of interests, including basic and continuing education for test professionals, the latest research developments, new directions and hot topics in test, and expert perspectives on current issues. The proceedings explores high speed interconnect testing, analog and mixed signal testing, delay testing, flash and memory testing, RF testing, yield analysis, nanoscale testing, IDDQ, MEMS, and wireless testing.Integrated circuitsVery large scale integrationTestingIntegrated circuitsVery large scale integrationTestingCongressesIntegrated circuitsVery large scale integrationTesting.Integrated circuitsVery large scale integrationTesting621.395PQKBPROCEEDING991014545350332124th IEEE VLSI Test Symposium (VTS 2006): 30 April - 04 May 20062384931UNINA