01756nam 2200469 450 991014511340332120230721004443.01-5090-7977-7(CKB)1000000000695743(SSID)ssj0000394404(PQKBManifestationID)12172025(PQKBTitleCode)TC0000394404(PQKBWorkID)10387929(PQKB)11496523(WaSeSS)IndRDA00124306(EXLCZ)99100000000069574320200606d2008 uy 0engur|||||||||||txtccr4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) 23-25 January 2008, Hong Kong, China /IEEE Computer SocietyPiscataway, New Jersey :Institute of Electrical and Electronics Engineers,2008.1 online resource (84 pages)Bibliographic Level Mode of Issuance: Monograph0-7695-3110-5 Fourth Institute of Electrical and Electronics Engineers International Symposium on Electronic Design, Test and Applications (delta 2008)ElectronicsDesignCongressesElectronicsTestingCongressesElectronicsDesignElectronicsTesting621.381Osseiran Adam1238040IEEE Computer Society,IEEE International Symposium on Electronic Design, Test and ApplicationsWaSeSSWaSeSSPROCEEDING99101451134033214th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008)2873447UNINA