02649nam 2200613Ia 450 991014472240332120170816141827.01-281-76425-697866117642583-527-61374-93-527-61375-7(CKB)1000000000377522(EBL)482155(OCoLC)261345508(SSID)ssj0000275599(PQKBManifestationID)11229914(PQKBTitleCode)TC0000275599(PQKBWorkID)10222806(PQKB)11041685(MiAaPQ)EBC482155(EXLCZ)99100000000037752219990502d1999 uys 0engur|n|---|||||txtccrX-ray characterization of materials[electronic resource] /Eric Lifshin (ed.)Weinheim ;New York Wiley-VCH19991 online resource (280 p.)Description based upon print version of record.3-527-29657-3 Includes bibliographical references and index.X-ray Characterization of Materials; Contents; List of Symbols and Abbreviations.; 1 X-Ray Diffraction; 2 Application of Synchrotron X-Radiation to Problems in Materials Science; 3 X-Ray Fluorescence Analysis; 4 Small-Angle Scattering of X-Rays and Neutrons; IndexLinking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental compositX-ray spectroscopyMaterialsAnalysisSurfaces (Technology)AnalysisX-raysIndustrial applicationsElectronic books.X-ray spectroscopy.MaterialsAnalysis.Surfaces (Technology)Analysis.X-raysIndustrial applications.620.11272778.33Lifshin Eric856015MiAaPQMiAaPQMiAaPQBOOK9910144722403321X-ray characterization of materials1911228UNINA