01673nam0 22002893i 450 SUN008733220140710100201.64820120215d2003 |0itac50 baitaIT|||| |||||Valutazione e rappresentazione cartografica mediante G.I.S. della qualità del suolo nella piana destra Sele, bacino del fiume Tusciano sudtesi di laurea sperimentaleLucianna Guidarelatore Elio Coppola, correlatori Andrea Buondonno, Corrado Buondonno, Pierclaudio Odierna[Caserta]2003. -118 p.10 tab. ; [21] carte di tav. ; 30 cmSeconda Università degli studi di Napoli, Facoltà di scienze ambientali, anno accademico 2002-2003.TesiScienze ambientaliSASUNC029757CasertaSUNL000252Guida, LuciannaSUNV071534723267Buondonno, AndreaSUNV068397Coppola, ElioSUNV071419727Odierna, PierclaudioSUNV071447Buondonno, CorradoSUNV071527ITSOL20181109RICASUN0087332UFFICIO DI BIBLIOTECA DEL DIPARTIMENTO DI SCIENZE E TECNOLOGIE AMBIENTALI BIOLOGICHE E FARMACEUTICHE17 CONS Tesi II 4 17 OM 1101 7 UFFICIO DI BIBLIOTECA DEL DIPARTIMENTO DI SCIENZE E TECNOLOGIE AMBIENTALI BIOLOGICHE E FARMACEUTICHEIT-CE0101OM1101CONS Tesi II 4 7caValutazione e rappresentazione cartografica mediante G.I.S. della qualità del suolo nella piana destra Sele, bacino del fiume Tusciano sud1418416UNICAMPANIA02649nam 2200613Ia 450 991014472240332120170816141827.01-281-76425-697866117642583-527-61374-93-527-61375-7(CKB)1000000000377522(EBL)482155(OCoLC)261345508(SSID)ssj0000275599(PQKBManifestationID)11229914(PQKBTitleCode)TC0000275599(PQKBWorkID)10222806(PQKB)11041685(MiAaPQ)EBC482155(EXLCZ)99100000000037752219990502d1999 uys 0engur|n|---|||||txtccrX-ray characterization of materials[electronic resource] /Eric Lifshin (ed.)Weinheim ;New York Wiley-VCH19991 online resource (280 p.)Description based upon print version of record.3-527-29657-3 Includes bibliographical references and index.X-ray Characterization of Materials; Contents; List of Symbols and Abbreviations.; 1 X-Ray Diffraction; 2 Application of Synchrotron X-Radiation to Problems in Materials Science; 3 X-Ray Fluorescence Analysis; 4 Small-Angle Scattering of X-Rays and Neutrons; IndexLinking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental compositX-ray spectroscopyMaterialsAnalysisSurfaces (Technology)AnalysisX-raysIndustrial applicationsElectronic books.X-ray spectroscopy.MaterialsAnalysis.Surfaces (Technology)Analysis.X-raysIndustrial applications.620.11272778.33Lifshin Eric856015MiAaPQMiAaPQMiAaPQBOOK9910144722403321X-ray characterization of materials1911228UNINA