02076oam 2200529zu 450 991014273970332120210807002715.01-5090-9743-0(CKB)1000000000330895(SSID)ssj0000395513(PQKBManifestationID)12171116(PQKBTitleCode)TC0000395513(PQKBWorkID)10451715(PQKB)11233415(EXLCZ)99100000000033089520160829d2005 uy engtxtccrSixth International Workshop on Microprocessor Test and Verification : common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 2005[Place of publication not identified]IEEE Computer Society2005Bibliographic Level Mode of Issuance: Monograph0-7695-2627-6 MicroprocessorsTestingCongressesIntegrated circuitsTestingCongressesIntegrated circuitsVerificationCongressesSystems on a chipTestingCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCMicroprocessorsTestingIntegrated circuitsTestingIntegrated circuitsVerificationSystems on a chipTestingElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering004.16IEEE Computer Society Technical Council on Test Technology.IEEE Xplore (Online service)International Workshop on Microprocessor Test and VerificationPQKBPROCEEDING9910142739703321Sixth International Workshop on Microprocessor Test and Verification : common challenges and solutions : MTV 2005 : proceedings : Austin, Texas, 3-4 November, 20052379143UNINA