01280oam 2200385z- 450 991014270620332120241212215507.097815090908841509090886(CKB)1000000000331244(EXLCZ)99100000000033124420220608c2006uuuu -u- -eng2006 IEEE International Test Conference Santa Clara, CA : 22-27 October 2006IEEE9781424402915 1424402913 9781424402922 1424402921 Autonomic Computing 2006 IEEE International Test ConferenceIntegrated circuitsTestingCongressesElectronic digital computersCircuitsTestingCongressesTelecommunicationCongressesRadio frequencyCongressesIntegrated circuitsTestingElectronic digital computersCircuitsTestingTelecommunicationRadio frequency621.3815/48Institute of Electrical and Electronics Engineers.Philadelphia Section.PROCEEDING99101427062033212006 IEEE International Test Conference2875556UNINA