01200oam 2200349z- 450 991014270620332120070818082434.01-5090-9088-6(CKB)1000000000331244(EXLCZ)99100000000033124420220608c2006uuuu -u- -eng2006 IEEE International Test Conference Santa Clara, CA : 22-27 October 2006IEEE1-4244-0291-3 1-4244-0292-1 Autonomic Computing 2006 IEEE International Test ConferenceIntegrated circuitsTestingCongressesElectronic digital computersCircuitsTestingCongressesTelecommunicationCongressesRadio frequencyCongressesIntegrated circuitsTestingElectronic digital computersCircuitsTestingTelecommunicationRadio frequency621.3815/48Institute of Electrical and Electronics Engineers.Philadelphia Section.PROCEEDING99101427062033212006 IEEE International Test Conference2875556UNINA