01012cam--2200349---450-99000352300020331620110420093652.0978-0-340-80770-5000352300USA01000352300(ALEPH)000352300USA0100035230020110419d2003----km-y0itay50------baengGBa---||||001yyCultural geography in practiceedited by Alison Blunt ... [et al.]LondonArnold2003XIII, 330 p.ill.25 cmGeografia umanaBNCF304.2BLUNT,AlisonITsalbcISBD990003523000203316III.1. 36075549 L.G.III.1.00295959BKUMAPASSARO9020110419USA010944PASSARO9020110419USA010947ANNAMARIA9020110420USA010936Cultural geography in practice253173UNISA01870oam 2200505zu 450 991014233230332120241212215418.097815386032391538603233(CKB)1000000000036198(SSID)ssj0000395446(PQKBManifestationID)12102724(PQKBTitleCode)TC0000395446(PQKBWorkID)10453321(PQKB)11331130(EXLCZ)99100000000003619820160829d2005 uy engtxtccr2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan[Place of publication not identified]IEEE Computer Society2005Bibliographic Level Mode of Issuance: Monograph9780769523132 0769523137 Semiconductor storage devicesTestingCongressesRandom access memoryCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSemiconductor storage devicesTestingRandom access memoryElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/732Guo li qing hua da xue (Hsinchu, Taiwan)IEEE Computer Society Technical Council on Test Technology.IEEE International Workshop on Memory Technology, Design, and TestingPQKBPROCEEDING99101423323033212005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan2342593UNINA