01133nam 2200361 450 991014218420332120180328085312.01-5386-0065-X(CKB)1000000000035911(WaSeSS)IndRDA00096701(EXLCZ)99100000000003591120180328d2005 || |engur|||||||||||txtrdacontentcrdamediacrrdacarrierDBT 2005 proceedings, 2005 IEEE International Workshop on Current and Defect Based Testing, 2005 : 1 May 2005New York :IEEE,2005.1 online resource (81 pages)1-4244-0034-1 Integrated circuitsDefectsCongressesIddq testingCongressesMetal oxide semiconductors, ComplementaryCongressesIntegrated circuitsDefectsIddq testingMetal oxide semiconductors, ComplementaryWaSeSSWaSeSSPROCEEDING9910142184203321DBT 20052422816UNINA