01243nam 2200373 450 991014190330332120180310110437.01-4799-6155-8(CKB)2560000000337559(WaSeSS)IndRDA00094296(EXLCZ)99256000000033755920180310d2014 || |engur|||||||||||txtrdacontentcrdamediacrrdacarrierDFT proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems : 1-3 October 2014, AmsterdamNew York :IEEE,2014.1 online resource (xvi, 190 pages)1-4799-6156-6 1-4799-6154-X Integrated circuitsVery large scale integrationCongressesNanotechnologyCongressesIntegrated circuitsFault toleranceCongressesIntegrated circuitsVery large scale integrationNanotechnologyIntegrated circuitsFault toleranceWaSeSSWaSeSSPROCEEDING9910141903303321DFT2505108UNINA