01279nam 2200385 450 991014175660332120171018112550.00-7381-5724-4(CKB)2670000000414800(WaSeSS)IndRDA00079143(NjHacI)992670000000414800(EXLCZ)99267000000041480020171018d2007 || |engur|||||||||||txtrdacontentcrdamediacrrdacarrierIEC standard testability method for embedded core-based integrated circuitsNew York :IEEE,2007.1 online resource (349 pages)2-8318-9481-6 Embedded computer systemsTestingStandardsSystems on a chipTestingStandardsIntegrated circuitsTestingStandardsEmbedded computer systemsTestingStandards.Systems on a chipTestingStandards.Integrated circuitsTestingStandards.621.38173WaSeSSWaSeSSDOCUMENT9910141756603321IEC standard testability method for embedded core-based integrated circuits2575740UNINA