01824oam 2200493zu 450 991014004770332120241212215749.097815090733511509073353(CKB)1000000000812293(SSID)ssj0000526972(PQKBManifestationID)12231097(PQKBTitleCode)TC0000526972(PQKBWorkID)10522019(PQKB)10528555(EXLCZ)99100000000081229320160829d2009 uy engtxtccrMTDT 2009 : 2009 IEEE International Workshop on Memory Technology, Design, and Testing : proceedings, 31 August- 2 September 2009, Hsinchu, Taiwan[Place of publication not identified]IEEE Computer Society2009Bibliographic Level Mode of Issuance: Monograph9780769537979 0769537979 Semiconductor storage devicesTestingCongressesRandom access memoryCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSemiconductor storage devicesTestingRandom access memoryElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering004.568IEEE Computer SocietyIEEE International Workshop on Memory Technology, Design, and TestingPQKBPROCEEDING9910140047703321MTDT 2009 : 2009 IEEE International Workshop on Memory Technology, Design, and Testing : proceedings, 31 August- 2 September 2009, Hsinchu, Taiwan2337594UNINA