01732oam 2200481zu 450 991014001540332120241212215752.097815090756761509075674(CKB)1000000000812143(SSID)ssj0000396684(PQKBManifestationID)12138651(PQKBTitleCode)TC0000396684(PQKBWorkID)10334461(PQKB)10352073(EXLCZ)99100000000081214320160829d2009 uy engtxtccr2009 27th IEEE VLSI Test Symposium : proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 2009[Place of publication not identified]IEEE Computer Society2009Bibliographic Level Mode of Issuance: Monograph9780769535982 0769535984 Integrated circuitsVery large scale integrationTestingCongressesElectrical EngineeringHILCCElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsVery large scale integrationTestingElectrical EngineeringElectrical & Computer EngineeringEngineering & Applied Sciences621.39/5Institute of Electrical and Electronics EngineersIEEE Computer Society Test Technology Technical CommitteeIEEE VLSI Test SymposiumPQKBPROCEEDING99101400154033212009 27th IEEE VLSI Test Symposium : proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 20092415234UNINA