01435nam 2200385 450 991013997040332120230803194711.01-4799-7274-6(CKB)2560000000337773(WaSeSS)IndRDA00119897(EXLCZ)99256000000033777320200311d2014 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2014 IEEE International Integrated Reliability Workshop final report Stanford Sierra Conference Center, South Lake Tahoe, California, October 12-16, 2014 /sponsored by the IEEE Electron Devices Society and the IEEE Reliability SocietyPiscataway, New Jersey :Institute of Electrical and Electronics Engineers,2014.1 online resource (57 pages)1-4799-7275-4 1-4799-7308-4 SemiconductorsReliabilityCongressesIntegrated circuitsReliabilityCongressesSemiconductorsReliabilityIntegrated circuitsReliability621.38152IEEE Electron Devices Society,IEEE Reliability Society,WaSeSSWaSeSSPROCEEDING99101399704033212014 IEEE International Integrated Reliability Workshop final report2518378UNINA