01133nam 2200361 450 991013985530332120180302153049.01-5090-8449-5(CKB)1000000000812017(WaSeSS)IndRDA00093286(EXLCZ)99100000000081201720180302d2008 || |engur|||||||||||txtrdacontentcrdamediacrrdacarrier2008 17th Asian Test Symposium 24-27 November 2008New York :IEEE,2008.1 online resource (456 pages)0-7695-3396-5 Fault-tolerant computingCongressesElectronic circuitsTestingCongressesElectronic digital computersCircuitsTestingCongressesFault-tolerant computingElectronic circuitsTestingElectronic digital computersCircuitsTestingWaSeSSWaSeSSPROCEEDING99101398553033212008 17th Asian Test Symposium2356788UNINA