01529oam 2200481zu 450 991013910050332120241212215901.09781424469154142446915597814244691471424469147(CKB)2560000000009607(SSID)ssj0000452188(PQKBManifestationID)12142585(PQKBTitleCode)TC0000452188(PQKBWorkID)10468244(PQKB)10283246(NjHacI)992560000000009607(EXLCZ)99256000000000960720160829d2010 uy engur|||||||||||txtccr2010 International Conference on Microelectronic Test Structures[Place of publication not identified]I E E E20101 online resource illustrationsBibliographic Level Mode of Issuance: Monograph9781424469123 1424469120 This page or pages intentionally left blank.Electronic apparatus and appliancesTestingCongressesIntegrated circuitsTestingCongressesElectronic apparatus and appliancesTestingIntegrated circuitsTesting621.3810287IEEE StaffPQKBPROCEEDING99101391005033212010 International Conference on Microelectronic Test Structures2537646UNINA