05509nam 2200673Ia 450 991013907800332120200520144314.01-283-59303-397866139054821-118-52091-21-118-52099-81-118-52092-0(CKB)2560000000092791(EBL)1016650(SSID)ssj0000711463(PQKBManifestationID)11444688(PQKBTitleCode)TC0000711463(PQKBWorkID)10693319(PQKB)10399618(MiAaPQ)EBC1016650(OCoLC)676862591(EXLCZ)99256000000009279119960312d1996 uy 0engur|n|---|||||txtccrIntroduction to X-ray powder diffractometry /Ron Jenkins, Robert L. SnyderNew York Wileyc19961 online resource (428 p.)Chemical analysis ;v. 138"A Wiley-Interscience publication."0-471-51339-3 Includes bibliographical references and index.Introduction to X-ray Powder Diffractometry; CONTENTS; PREFACE; CUMULATIVE LISTING OF VOLUMES IN SERIES; CHAPTER 1. CHARACTERISTICS OF X-RADIATION; 1.1. Early Development of X-ray Diffraction; 1.2. Origin of X-radiation; 1.3. Continuous Radiation; 1.4. Characteristic Radiation; 1.4.1. The Photoelectric Effect; 1.4.2. The Auger Effect; 1.4.3. Fluorescent Yield; 1.4.4. Selection Rules; 1.4.5. Nondiagram Lines; 1.4.6. Practical Form of the Copper K Spectrum; 1.5. Scattering of X-rays; 1.5.1. Coherent Scatter; 1.5.2. Compton Scatter; 1.6. Absorption of X-rays; 1.7. Safety ConsiderationsReferencesCHAPTER 2. THE CRYSTALLINE STATE; 2.1. Introduction to the Crystalline State; 2.2. Crystallographic Symmetry; 2.2.1. Point Groups and Crystal Systems; 2.2.2. The Unit Cell and Bravais Lattices; 2.2.3. Reduced Cells; 2.2.4. Space Groups; 2.3. Space Group Notation; 2.3.1. The Triclinic or Anorthic Crystal System; 2.3.2. The Monoclinic Crystal System; 2.3.3. The Orthorhombic Crystal System; 2.3.4. The Tetragonal Crystal System; 2.3.5. The Hexagonal and Trigonal Crystal Systems; 2.3.6. The Cubic Crystal System; 2.3.7. Equivalent Positions; 2.3.8. Special Positions and Site Multiplicity2.4. Space Group Theory2.5. Crystallographic Planes and Miller Indices; References; CHAPTER 3. DIFFRACTION THEORY; 3.1. Diffraction of X-rays; 3.2. The Reciprocal Lattice; 3.3. The Ewald Sphere of Reflection; 3.4. Origin of the Diffraction Pattern; 3.4.1. Single Crystal Diffraction; 3.4.2. The Powder Diffraction Pattern; 3.5. The Location of Diffraction Peaks; 3.6. Intensity of Diffraction Peaks; 3.6.1. Electron Scattering; 3.6.2. The Atomic Scattering Factor; 3.6.3. Anomalous Scattering; 3.6.4. Thermal Motion; 3.6.5. Scattering of X-rays by a Crystal: The Structure Factor3.7. The Calculated Diffraction Pattern3.7.1. Factors Affecting the Relative Intensity of Bragg Reflections; 3.7.2. The Intensity Equation; 3.8. Calculation of the Powder Diffraction Pattern of KCl; 3.9. Anisotropic Distortions of the Diffraction Pattern; 3.9.1. Preferred Orientation; 3.9.2. Crystallite Size; 3.9.3. Residual Stress and Strain; References; CHAPTER 4. SOURCES FOR THE GENERATION OF X-RADIATION; 4.1. Components of the X-ray Source; 4.2. The Line-Voltage Supply; 4.3. The High-Voltage Generator; 4.3.1. Selection of Operating Conditions; 4.3.2. Source Stability4.4. The Sealed X-ray Tube4.4.1. Typical X-ray Tube Configuration; 4.4.2. Specific Loading; 4.4.3. Care of the X-ray Tube; 4.5. Effective Line Width; 4.6. Spectral Contamination; 4.6.1. X-ray Tube Life; 4.7. The Rotating Anode X-ray Tube; References; CHAPTER 5. DETECTORS AND DETECTION ELECTRONICS; 5.1. X-ray Detectors; 5.2. Desired Properties of an X-ray Detector; 5.2.1. Quantum-Counting Efficiency; 5.2.2. Linearity; 5.2.3. Energy Proportionality; 5.2.4. Resolution; 5.3. Types of Detector; 5.3.1. The Gas Proportional Counter; 5.3.2. Position-Sensitive Detectors5.3.3. The Scintillation DetectorWhen bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range of uses, from the analysis of moon rocks to testing drugs for purity.Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation oChemical Analysis: A Series of Monographs on Analytical Chemistry and Its ApplicationsX-raysDiffractionTechniqueX-ray diffractometerPowdersOptical propertiesMeasurementX-raysDiffractionTechnique.X-ray diffractometer.PowdersOptical propertiesMeasurement.548/.83Jenkins Ron1932-52234Snyder R. L(Robert L.),1941-951592MiAaPQMiAaPQMiAaPQBOOK9910139078003321Introduction to X-ray powder diffractometry2151310UNINA