05240nam 22006611 450 991013901320332120230803021704.03-527-65508-53-527-65506-93-527-65509-3(CKB)2550000001117149(EBL)1388818(OCoLC)858655510(SSID)ssj0001164473(PQKBManifestationID)11635401(PQKBTitleCode)TC0001164473(PQKBWorkID)11181089(PQKB)10943451(MiAaPQ)EBC1388818(Au-PeEL)EBL1388818(CaPaEBR)ebr10762543(CaONFJC)MIL517587(EXLCZ)99255000000111714920131006d2013 uy 0engurcnu||||||||txtccrNanobeam x-ray scattering probing matter at the nanoscale /Julian Stangl [and three others]Hoboken, New Jersey :John Wiley & sons,2013.1 online resource (284 p.)Description based upon print version of record.3-527-41077-5 1-299-86336-1 Includes bibliographical references and index.Nanobeam X-Ray Scattering; Contents; Foreword; Preface; 1 Introduction; 1.1 X-ray Interaction with Matter; 1.1.1 Transmission of X-ray; 1.1.2 Diffraction of X-rays; 1.1.3 X-ray Elemental Sensitivity; 1.2 Diffraction at Different Length scales and Real-Space Resolution; 1.2.1 How to Produce an X-ray Nanobeam; 1.2.2 Experiments with Nanobeams; 1.2.3 Coherence Properties of Small Beams; 1.2.4 Side Issues ?; 1.3 Future Developments; 2 X-ray Diffraction Principles; 2.1 A Brief Introduction to Diffraction Theory; 2.1.1 Interference of X-ray Waves; 2.2 Kinematic X-ray Diffraction Theory2.2.1 The Structure Factor 2.2.2 The Form Factor; 2.2.3 Reciprocal Lattice of Nanostructures; 2.2.4 The Phase Problem; 2.3 Reflectivity; 2.4 Properties of X-ray Beams; 2.5 A Note on Coherence; 2.5.1 Longitudinal Coherence and Wavelength Distribution; 2.5.2 Longitudinal Coherence Length; 2.5.3 Transverse Coherence and Thermal Sources; 2.5.4 Transverse Coherence Length; 2.6 X-ray Sources; 2.7 Diffraction Measurement: How to Access q in a Real Experiment; 2.7.1 Diffraction Geometries; 2.7.2 Length scales; 3 X-ray Focusing Elements Characterization; 3.1 Introduction and Context3.2 Refractive X-ray Lenses 3.2.1 Characterization of Focusing Elements; 3.2.2 Spherical Refractive X-ray Lenses; 3.2.3 Parabolic Compound Refractive Lenses (CRL); 3.2.4 Kinoform Lenses; 3.2.5 Characteristics of the Refractive Lenses; 3.3 X-ray Mirrors. Reflection of X-rays at Surfaces; 3.3.1 Reflective X-ray Optics (Kirkpatrick-Baez Mirrors); 3.3.2 Capillaries; 3.3.3 Waveguides (Resonators); 3.3.4 Other Reflective Optical Elements; 3.4 Diffraction X-ray Optics; 3.4.1 Fresnel Zone Plates; 3.4.2 Hologram of a Point Object; 3.4.3 Quantities Characterizing a Binary Zone Plate3.4.4 Multilevel Zone Plate 3.4.5 Getting a Clean and Intense Focused Beam with ZPs; 3.4.6 Bragg-Fresnel Lenses; 3.4.7 Multilayer Laue Lenses; 3.4.8 Photon Sieves; 3.4.9 Beam Compressors; 3.5 Other X-ray Optics; 3.6 Measuring the Size of the X-ray Focused Spot; 3.7 Conclusion; 4 Scattering Experiments Using Nanobeams; 4.1 From the Ensemble Average Approach towards the Single Nanostructure Study; 4.1.1 A Motivation for the Use of Small X-ray Beams; 4.1.2 Required Focused Beam Properties; 4.2 Scanning X-ray Diffraction Microscopy; 4.3 Finite Element Based Analysis of Diffraction Data4.4 Single Structure Inside a Device 4.5 Examples from Biology; 4.6 Recent Experiments: The Current Limits; 4.6.1 Strain Distribution in Nanoscale Ridges; 4.6.2 Between Single Structure and Ensemble Average; 4.7 Outlook; 4.7.1 Experimental Developments; 5 Nanobeam Diffraction Setups; 5.1 Introduction; 5.2 Typical X-ray Diffraction Setup; 5.3 Nanodiffraction Setup Requirements; 5.3.1 Diffractometer; 5.3.2 Restriction of Setup; 5.3.3 Stability: How to Keep the Beam on the Sample; 5.3.4 Beating Drifts: More Solutions; 5.4 Nanobeam and Coherence Setup5.5 Detectors: Pixel and Time Resolution, Dynamical RangeA comprehensive overview of the possibilities and potential of X-ray scattering using nanofocused beams for probing matter at the nanoscale, including guidance on the design of nanobeam experiments. The monograph discusses various sources, including free electron lasers, synchrotron radiation and other portable and non-portable X-ray sources.For scientists using synchrotron radiation or students and scientists with a background in X-ray scattering methods in general.Electron probe microanalysisNanotechnologyX-raysScatteringElectron probe microanalysis.Nanotechnology.X-raysScattering.539.7222Stangl Julian942394MiAaPQMiAaPQMiAaPQBOOK9910139013203321Nanobeam x-ray scattering2126595UNINA01599oam 2200409Ia 450 991069973290332120110203082117.0(CKB)5470000002405619(OCoLC)700167204(EXLCZ)99547000000240561920110203d2009 ua 0engurbn|||||||||txtrdacontentcrdamediacrrdacarrierFurther model-based estimates of U.S. total manufacturing production capital and technology, 1949-2005[electronic resource] /Baoline Chen, Peter A. Zadrozny[Washington, D.C.] :U.S. Dept. of Labor, Bureau of Labor Statistics, Office of Prices and Living Conditions,[2009]1 online resource (29 pages) digital, PDF fileWorking paper ;430Title from title screen (viewed on Feb. 2, 2011)."September 2009."Includes bibliographical references (pages 22-23).CapitalUnited StatesEconometric modelsTechnologyEconomic aspectsUnited StatesCapitalEconometric models.TechnologyEconomic aspectsChen Baoline1395158Zadrozny Peter A146493United States.Office of Prices and Living Conditions.GPOGPOGPOBOOK9910699732903321Further model-based estimates of U.S. total manufacturing production capital and technology, 1949-20053478559UNINA