02125oam 2200577zu 450 991013893410332120241212215814.097814244602671424460263(CKB)2400000000002664(SSID)ssj0001679730(PQKBManifestationID)16489667(PQKBTitleCode)TC0001679730(PQKBWorkID)15014117(PQKB)11466052(EXLCZ)99240000000000266420160829d2010 uy engtxtccrDELTA 2010 : Fifth IEEE International Symposium on Electronic Design, Test & Applications : proceedings : 13-15 January 2010, Ho Chi Minh City, Vietnam[Place of publication not identified]IEEE Computer Society2010Bibliographic Level Mode of Issuance: Monograph9781424460250 1424460255 9780769539782 0769539785 ElectronicsResearchCongressesElectronicsDesignCongressesElectronicsTestingCongressesElectrical EngineeringHILCCElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectronicsResearchElectronicsDesignElectronicsTestingElectrical EngineeringElectrical & Computer EngineeringEngineering & Applied Sciences621.381IEEE Computer Society,IEEE Computer Society Technical Council on Test Technology.£òai hòoc quâãoc gia TP Háão Châi MinhIEEE Vietnam Section,IEEE International Symposium on Electronic Design, Test and Applications.PQKBPROCEEDING9910138934103321DELTA 2010 : Fifth IEEE International Symposium on Electronic Design, Test & Applications : proceedings : 13-15 January 2010, Ho Chi Minh City, Vietnam2415597UNINA