01362oam 2200469zu 450 991013878950332120241212215755.09781509069330150906933X97814244486781424448670(CKB)2400000000001728(SSID)ssj0000452372(PQKBManifestationID)12175855(PQKBTitleCode)TC0000452372(PQKBWorkID)10471606(PQKB)10302420(NjHacI)992400000000001728(EXLCZ)99240000000000172820160829d2009 uy engur|||||||||||txtccr2009 International Test Conference[Place of publication not identified]IEEE20091 online resource illustrationsBibliographic Level Mode of Issuance: Monograph9781424448685 1424448689 Integrated circuitsTestingCongressesSemiconductorsTestingCongressesIntegrated circuitsTestingSemiconductorsTesting621.381548IEEE StaffPQKBPROCEEDING99101387895033212009 International Test Conference2532261UNINA