01754nam0 22003853i 450 CAG158493620231121125421.0978885552974720161122d2008 ||||0itac50 baitalatitz01i xxxe z01nCarmina latina epigraphica Moesica (CLEMoes)Carmina latina epigraphica Thraciae (CLEThr)[raccolti e ordinati da] Paolo Cugusi, Maria Teresa Sblendorio CugusiBolognaPàtron2008191 p.22 cmTesti e manuali per l'insegnamento universitario del latino. Nuova serie104001CFI06405832001 Testi e manuali per l'insegnamento universitario del latino. Nuova serie1042001 Carmina latina epigraphica ThraciaeCarmina latina epigraphicaFIRRMLC364136I871.01Poesia latina. Origini-50021Cugusi, PaoloCFIV064286070Sblendorio Cugusi, Maria TeresaLO1V026832Cugusi, PaulusCFIV119082Cugusi, PaoloSblendorio Cugusi, Maria TheresiaCFIV315847Sblendorio Cugusi, Maria TeresaCugusi, Maria TeresaLO1V026833Sblendorio Cugusi, Maria TeresaITIT-0120161122IT-FR0017 Biblioteca umanistica Giorgio ApreaFR0017 NCAG1584936Biblioteca umanistica Giorgio Aprea 52MAG 7 Coll E 104 52FLS0000333405 VMN RS A 2016112220161122 52Carmina latina epigraphica Thraciae (CLEThr)3604312Carmina latina epigraphica Moesica (CLEMoes)3604311UNICAS02460oam 2200481zu 450 991013878640332120241212215758.097814244569181424456916(CKB)2400000000001743(SSID)ssj0000452567(PQKBManifestationID)12168508(PQKBTitleCode)TC0000452567(PQKBWorkID)10472039(PQKB)10848315(NjHacI)992400000000001743(EXLCZ)99240000000000174320160829d2010 uy engur|||||||||||txtccr2010 42nd Southeastern Symposium on System Theory[Place of publication not identified]I E E E20101 online resource illustrationsBibliographic Level Mode of Issuance: Monograph9781424456901 1424456908 Soft errors are caused by cosmic rays striking sensitive regions in electronic devices. Termed as single event upset (SEU), in the past this phenomenon mostly affected the high altitude systems or avionics. The small geometries of today's nanodevices and their use in high-density and high-complexity designs make electronic systems sensitive even to the ground-level radiation. Therefore, large computer systems like workstations or computer web servers have become major victims of single event upsets. Given that the idea of cloud computing is an unavoidable trend for the next generation internet, which might involve almost every company in the IT industry, the urgency and criticality of the reliability rise higher then ever. This paper illustrates how soft errors are a reliability concern for computer servers. The soft error reduction techniques that are significant for the IT industry are summarized and a possible soft error rate (SER) reduction method that considers the cosmic ray striking angle to redesign the circuit board layout is proposed.Electronic data processingCongressesSystem analysisCongressesSystem theoryCongressesElectronic data processingSystem analysisSystem theory004IEEE StaffPQKBPROCEEDING99101387864033212010 42nd Southeastern Symposium on System Theory2546649UNINA