01745nam 2200409 450 991013878310332120180305182253.01-5090-7533-X(CKB)2400000000002609(WaSeSS)IndRDA00093456(EXLCZ)99240000000000260920180305d2009 || |engur|||||||||||txtrdacontentcrdamediacrrdacarrierThe IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems proceedings : Chicago, Illinois, 7-9 October 2009 /edited by Dimitris Gizopoulos, Mohammad Tehranipoor, and Spyros Tragoudas ; sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, the IEEE Test Technology Technical CouncilNew York :IEEE,2009.1 online resource (xxxi, 455 pages)Includes index.0-7695-3839-8 Fault-tolerant computingCongressesIntegrated circuitsVery large scale integrationDesign and constructionCongressesFault-tolerant computingIntegrated circuitsVery large scale integrationDesign and constructionGizopoulos DimitrisTehranipoor Mohammad H.1974-Tragoudas SpyrosIEEE Computer Society.Fault-Tolerant Computing Technical Committee,IEEE Computer Society.Technical Council on Test Technology,WaSeSSWaSeSSPROCEEDING9910138783103321The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems2368158UNINA