05339nam 2200649Ia 450 991013761540332120231031204114.01-283-64602-11-118-36069-91-118-36068-01-118-36066-4(CKB)3190000000032942(EBL)894402(OCoLC)812067151(SSID)ssj0000717587(PQKBManifestationID)11956149(PQKBTitleCode)TC0000717587(PQKBWorkID)10739974(PQKB)11312083(MiAaPQ)EBC894402(WaSeSS)Ind00046274(Au-PeEL)EBL894402(CaPaEBR)ebr10606048(CaONFJC)MIL395852(EXLCZ)99319000000003294220120302d2012 uy 0engurnn|---|||||txtccrAtomic force microscopy[electronic resource] understanding basic modes and advanced applications /Greg HaugstadHoboken, N.J. John Wiley & Sonsc20121 online resource (488 p.)Description based upon print version of record0-470-63882-6 Includes bibliographical references and indexAtomic Force Microscopy: Understanding Basic Modes and Advanced Applications; Contents; Preface; Acknowledgments; 1. Overview of AFM; 1.1. The Essence of the Technique; 1.2. Property Sensitive Imaging: Vertical Touching and Sliding Friction; 1.3. Modifying a Surface with a Tip; 1.4. Dynamic (or "AC" or "Tapping") Modes: Delicate Imaging with Property Sensitivity; 1.5. Force Curves Plus Mapping in Liquid; 1.6. Rate, Temperature, and Humidity-Dependent Characterization; 1.7. Long-Range Force Imaging Modes; 1.8. Pedagogy of Chapters; References; 2. Distance-Dependent Interactions2.1. General Analogies and Types of Forces2.2. Van der Waals and Electrostatic Forces in a Tip-Sample System; 2.2.1. Dipole-Dipole Forces; 2.2.2. Electrostatic Forces; 2.3. Contact Forces and Mechanical Compliance; 2.4. Dynamic Probing of Distance-Dependent Forces; 2.4.1. Importance of Force Gradient; 2.4.2. Damped, Driven Oscillator: Concepts and Mathematics; 2.4.3. Effect of Tip-Sample Interaction on Oscillator; 2.4.4. Energy Dissipation in Tip-Sample Interaction; 2.5. Other Distance-Dependent Attraction and Repulsion: Electrostatic and Molecular Forces in Air and Liquids2.5.1. Electrostatic Forces in Liquids: Superimposed on Van der Waals Forces2.5.2. Molecular-Structure Forces in Liquids; 2.5.3. Macromolecular Steric Forces in Liquids; 2.5.4. Derjaguin Approximation: Colloid Probe AFM; 2.5.5. Macromolecular Extension Forces (Air and Liquid Media); 2.6. Rate/Time Effects; 2.6.1. Viscoelasticity; 2.6.2. Stress-Modified Thermal Activation; 2.6.3. Relevance to Other Topics of Chapter 2; References; 3. Z-Dependent Force Measurements with AFM; 3.1. Revisit Ideal Concept; 3.2. Force-Z Measurement Components: Tip/Cantilever/Laser/Photodetector/Z Scanner3.2.1. Basic Concepts and Interrelationships3.2.2. Tip-Sample Distance; 3.2.3. Finer Quantitative Issues in Force-Distance Measurements; 3.3. Physical Hysteresis; 3.4. Optical Artifacts; 3.5. Z Scanner/Sensor Hardware: Nonidealities; 3.6. Additional Force-Curve Analysis Examples; 3.6.1. Glassy Polymer, Rigid Cantilever; 3.6.2. Gels, Soft Cantilever; 3.6.3. Molecular-Chain Bridging Adhesion; 3.6.4. Bias-Dependent Electrostatic Forces in Air; 3.6.5. Screened Electrostatic Forces in Aqueous Medium; 3.7. Cantilever Spring Constant Calibration; References; 4. Topographic Imaging4.1. Idealized Concepts4.2. The Real World; 4.2.1. The Basics: Block Descriptions of AFM Hardware; 4.2.2. The Nature of the Collected Data; 4.2.3. Choosing Setpoint: Effects on Tip-Sample Interaction and Thereby on Images; 4.2.4. Finite Response of Feedback Control System; 4.2.5. Realities of Piezoscanners: Use of Closed-Loop Scanning; 4.2.6. Shape of Tip and Surface; 4.2.7. Other Realities and Operational Difficulties-Variable Background, Drift, Experimental Geometry; References; 5. Probing Material Properties I: Phase Imaging5.1. Phase Measurement as a Diagnostic of Interaction Regime and BistabilityThis book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. "Supplementary material for this book can be found by entering ISBN 9780470638828 on booksuppoAtomic force microscopyScanning proble microscopyAtomic force microscopyScanning proble microscopy620/.5Haugstad Greg1963-857941MiAaPQMiAaPQMiAaPQBOOK9910137615403321Atomic force microscopy1915560UNINA