01514nam 2200397 450 00001622620050718115600.03-540-64766-X20030905d1999----km-y0itay0103----baengDEModern cryptography, probabilistic proofs, and pseudorandomnessOded GoldreichBerlin [etc.]Springerc1999XV, 182 p.25 cm.Algorithms and Combinatorics172001Algorithms and CombinatoricsCrittografia005.82(20. ed.)Sicurezza dei dati. Cifraggio dei dati68-02Computer science. Research exposition03B99Mathematical logic and foundations. General logic60A99Probability theory and stochastic processes. Foundations of probability theoryGoldreich,Oded66329ITUniversità della Basilicata - B.I.A.RICAunimarc000016226Modern cryptography, probabilistic proofs, and pseudorandomness82174UNIBASMONSCISCIENZEEXT0020120030905BAS01104120050601BAS011755batch0120050718BAS01105320050718BAS01111220050718BAS01114220050718BAS011156BAS01BAS01BOOKBASA5Dipartimento MatematicaGENCollezione generaleMAT5006M50062003090551Riservati01438nam 2200337 450 991013754400332120231206213738.01-5044-0625-7(CKB)3710000000553786(NjHacI)993710000000553786(EXLCZ)99371000000055378620231206d2015 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIEEE Std C57.12.59-2015 (Revision of IEEE Std C57.12.59-2001) - Redline IEEE Guide for Dry-Type Transformer Through-Fault Current Duration - Redline /Institute of Electrical and Electronics EngineersPiscataway, New Jersey :IEEE,2015.1 online resource (35 pages)Recommendations believed essential for the application of overcurrent protective devices that limit the exposure time of dry-type transformers to short-circuit currents are set forth in this guide. This guide is not intended to imply overload capability.IEEE Std C57.12.59-2015 Transients (Electricity)ProtectionStandardsTransients (Electricity)ProtectionStandards.621.314NjHacINjHaclDOCUMENT9910137544003321IEEE Std C57.12.59-2015 (Revision of IEEE Std C57.12.59-2001) - Redline3647310UNINA