02265nam 2200373 450 991013736560332120231206213739.01-5044-0580-310.1109/IEEESTD.2015.7358452(CKB)3710000000553804(NjHacI)993710000000553804(EXLCZ)99371000000055380420231206d2015 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIEC 63003 Edition 1.0 2015-12 IEEE Std 1505.1 IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM) /Institute of Electrical and Electronics EngineersPiscataway, New Jersey :IEEE,2015.1 online resource (175 pages)This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).63003-2015 - IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505IEC 63003 Edition 1.0 2015-12 IEEE Std 1505.1Computer input-output equipmentComputer input-output equipment.004.7NjHacINjHaclDOCUMENT9910137365603321IEC 63003 Edition 1.0 2015-12 IEEE Std 1505.13646208UNINA