01391nam 2200373 450 991013638360332120231206214306.01-5044-0596-X10.1109/IEEESTD.2016.7436703(CKB)3710000000614411(NjHacI)993710000000614411(EXLCZ)99371000000061441120231206d2016 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIEEE Std 1149.6-2015 (Revision of IEEE Std 1149.6-2003) IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks /Institute of Electrical and Electronics EngineersPiscataway, NJ, USA :IEEE,2016.1 online resource (230 pages)IEEE Std 1149.1(TM) is augmented by this standard to improve the ability for testing differential and/or ac-coupled interconnections between integrated circuits on circuit boards and systems.IEEE Std 1149.6-2015 Boundary scan testingMicroelectronicsBoundary scan testing.Microelectronics.621.3815NjHacINjHaclDOCUMENT9910136383603321IEEE Std 1149.6-2015 (Revision of IEEE Std 1149.6-2003)3646405UNINA