01435nam 2200397 450 991013636630332120180313133422.01-4673-7396-6(CKB)3710000000619021(WaSeSS)IndRDA00094663(NjHacI)993710000000619021(EXLCZ)99371000000061902120180313d2016 || |engur|||||||||||txtrdacontentcrdamediacrrdacarrier2015 IEEE International Integrated Reliability Workshop Final Report S. Lake Tahoe, California, October 11-15, 2015New York :IEEE,2016.1 online resource (183 pages)1-4673-7397-4 1-4673-7395-8 PLATFORM TECHNICAL PRESENTATIONS -- POSTER PRESENTATIONS-REFEREED -- POSTER PRESENTATIONS-OPEN -- Tutorials -- Discussion Group (DG) Summaries -- BIOGRAPHIES -- PICTURES.Integrated circuitsReliabilityCongressesSemiconductorsReliabilityCongressesIntegrated circuitsReliabilitySemiconductorsReliability621.3815Ryan Jason1350555WaSeSSWaSeSSPROCEEDING99101363663033212015 IEEE International Integrated Reliability Workshop Final Report3088837UNINA