01014nam 2200325 450 991013627420332120231206214000.01-5044-0276-6(CKB)3710000000589846(NjHacI)993710000000589846(EXLCZ)99371000000058984620231206d1992 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierANSI/IEEE Std 300-1982 (Revision of IEEE No 300-1969) IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors /Institute of Electrical and Electronics EngineersNew York :IEEE,1992.1 online resource (154 pages)ANSI/IEEE Std 300-1982 Semiconductor industrySemiconductor industry.338.4NjHacINjHaclDOCUMENT9910136274203321ANSI2072434UNINA