01693nam 2200373 450 991013587640332120231207090155.00-7381-8152-8(CKB)3780000000090170(NjHacI)993780000000090170(EXLCZ)99378000000009017020231207d2009 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIEEE Std 1671.1-2009 (Full_Use) /IEEENew York :IEEE,2009.1 online resource (195 pages)This document specifies an exchange format, using the extensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a Unit Under Test (UUT). This is in support of the development of Test Program Sets (TPSs) that will be used in an automatic test environment.1671.1-2009 - IEEE Standard for Automatic Test Markup Language IEEE Std 1671.1-2009 (Full_Use): IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test DescriptionsIEEE Standard for Automatic Test Markup Language IEEE Std 1671.1-2009 Automatic test equipmentAutomatic test equipment.621.381548NjHacINjHaclDOCUMENT9910135876403321IEEE Std 1671.1-2009 (Full_Use)2577088UNINA