01762nam 2200349 450 991013576460332120231206174007.00-7381-2776-010.1109/IEEESTD.1986.79645(CKB)3780000000089242(NjHacI)993780000000089242(EXLCZ)99378000000008924220231206d1986 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierANSI/IEEE Std 943-1986 IEEE Guide for Aging Mechanisms and Diagnostic Procedures in Evaluating Electrical Insulation Systems /Institute of Electrical and Electronics EngineersPiscataway, NJ :IEEE,1986.1 online resourceBackground information necessary for proper construction of aging mechanisms and selection of diagnostic procedures when designing tests for functional evaluation of insulation systems for electrical equipment is presented. Aging mechanisms of insulation systems and methods for ascertaining correlation of aging during testing and aging during actual service are described. Diagnostic techniques for use in functional tests are also listed. The intent is primarily to aid committees in standardizing tests within the scope of their responsibilities.ANSI/IEEE Std 943-1986: IEEE Guide for Aging Mechanisms and Diagnostic Procedures in Evaluating Electrical Insulation SystemsElectric insulators and insulationTestingElectric insulators and insulationTesting.621.31937NjHacINjHaclDOCUMENT9910135764603321ANSI2072434UNINA