01786oam 2200457 450 991070499290332120140702093608.0(CKB)5470000002445812(OCoLC)861798686(EXLCZ)99547000000244581220131031d2013 ua 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierCurrent and projected national security threats to the United States hearing before the Select Committee on Intelligence of the United States Senate, One Hundred Thirteenth Congress, first session, Tuesday, March 12, 2013Washington :U.S. Government Printing Office,2013.1 online resource (iii, 67 pages)S. hrg. ;113-89Title from title screen (viewed on October 31, 2013).Paper version available for sale by the Superintendent of Documents, United States Government Printing Office.Current and projected national security threats to the United States National securityUnited StatesTerrorismRisk assessmentUnited StatesTerrorismUnited StatesPreventionTerrorismForecastingIntelligence serviceUnited StatesLegislative hearings.lcgftNational securityTerrorismRisk assessmentTerrorismPrevention.TerrorismForecasting.Intelligence serviceGPOGPOGPOBOOK9910704992903321Current and projected national security threats to the United States3187311UNINA01181nam 2200361 450 991013547660332120231208090801.00-7381-4384-710.1109/IEEESTD.1978.81706(CKB)3780000000092991(NjHacI)993780000000092991(EXLCZ)99378000000009299120231208d1978 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIEEE Std 581.1978 IEEE standard definitions, symbols, and characterization of metal-nitride-oxide field-effect transistors /IEEE[Place of publication not identified] :IEEE,1978.1 online resourceIEEE Std 581.1978: IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitride-Oxide Field-Effect TransistorsTransistorsEnergy systemsTransistors.Energy systems.621.38151NjHacINjHaclDOCUMENT9910135476603321IEEE Std 581.19782574009UNINA