01253nam 2200337 450 991013537370332120231208102103.00-7381-6951-X(CKB)3780000000092813(NjHacI)993780000000092813(EXLCZ)99378000000009281320231208d2008 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIEEE Std 1620-2008 (Revision of IEEE Std 1620-2004) - Redline /Institute of Electrical and Electronics Engineers[Place of publication not identified] :IEEE,2008.1 online resource (viii, 81 pages)IEEE Std 1620-2008 (Revision of IEEE Std 1620-2004) - Redline: IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials - RedlineIEEE Std 1620-2008 Information storage and retrieval systemsInformation storage and retrieval systems.025.04NjHacINjHaclDOCUMENT9910135373703321IEEE Std 1620-2008 (Revision of IEEE Std 1620-2004) - Redline2574934UNINA