01769nam 2200337 450 991013529120332120231207112238.00-7381-2704-3(CKB)3780000000090827(NjHacI)993780000000090827(EXLCZ)99378000000009082720231207d1995 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits /Institute of Electrical and Electronics EngineersNew York :IEEE,1995.1 online resourceIn this IEEE standard methods are established for testing and measuring the characteristics of surge protectors used in low-voltage data, communications, and signaling circuits with voltages less than or equal to 1000 V RMS or 1200 VDC. The surge protectors are designed to limit voltage surges, current surges, or both. The surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear elements. Tests are included for characterizing standby performance, surge-limiting capabilities, and surge lifetime.IEEE Std C62.36-1994: IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling CircuitsElectric circuitsCongressesElectric circuits621.3192NjHacINjHaclDOCUMENT9910135291203321IEEE standard test methods for surge protectors used in low-voltage data, communications, and signaling circuits2575244UNINA