01422nam 2200421 450 991013318350332120230609204851.01-4673-6020-1(CKB)3390000000045159(NjHacI)993390000000045159(EXLCZ)99339000000004515920230609d2013 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierNondestructive Evaluation/Testing New Technology & Application (FENDT), 2013 Far East Forum on /edited by Chunguang Xu, Qinxue PanPiscataway, NJ :IEEE Press,2013.©20131 online resource (various pagings) illustrations1-4673-6017-1 1-4673-6018-X Includes bibliographical references.2013 Far East Forum on Nondestructive Evaluation/Testing2013 Far East Forum on Nondestructive Evaluation/Testing: New Technology and ApplicationNondestructive Evaluation/TestingNondestructive testingCongressesNondestructive testing620.1127Pan QinxueXu ChunguangNjHacINjHaclPROCEEDING9910133183503321Nondestructive Evaluation2511557UNINA