00939nam 2200313 450 991013248100332120180310105336.01-4799-2611-6(CKB)3520000000004131(WaSeSS)IndRDA00094290(EXLCZ)99352000000000413120180310d2014 || |engur|||||||||||txtrdacontentcrdamediacrrdacarrierVTS 2014 IEEE 32nd VLSI Test Symposium : 13-17 April 2014New York :IEEE,2014.1 online resource (260 pages)1-4799-2612-4 Integrated circuitsVery large scale integrationTestingCongressesIntegrated circuitsVery large scale integrationTestingWaSeSSWaSeSSPROCEEDING9910132481003321VTS2532188UNINA