01303nam 2200385 450 991013235790332120231021042630.00-7695-5080-0(CKB)3460000000126471(NjHacI)993460000000126471(EXLCZ)99346000000012647120231021d2013 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2013 22nd Asian Test Symposium (ATS 2013) : Yilan, Taiwan, 18-21 November 2013 /Asian Test Symposium (22nd : 2013 : I-lan hsien, Taiwan)Piscataway, NJ, :IEEE,2013.1 online resource (309 pages) illustrations1-4799-0871-1 Test Symposium Electronic circuitsTestingCongressesElectronic digital computers CircuitsTestingCongressesFault-tolerant computingCongressesElectronic circuitsTestingElectronic digital computers CircuitsTestingFault-tolerant computing621.3815NjHacINjHaclPROCEEDING99101323579033212013 22nd Asian Test Symposium2503629UNINA