01422nam 2200397 450 991013130500332120230807215648.01-4799-8304-7(CKB)3710000000415348(WaSeSS)IndRDA00124055(EXLCZ)99371000000041534820200601d2015 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierICMTS 2015 proceedings of the 2015 IEEE International Conference on Microelectronic Test Structures : March 23-26, 2015, Doubletree Hotel, Tempe, Arizona /sponsored by the IEEE Electron Devices SocietyPiscataway, New Jersey :Institute of Electrical and Electronics Engineers,2015.1 online resource (217 pages)1-4799-8305-5 1-4799-8302-0 Integrated circuitsTestingCongressesSemiconductorsTestingCongressesElectronic apparatus and appliancesTestingCongressesIntegrated circuitsTestingSemiconductorsTestingElectronic apparatus and appliancesTesting621.381548IEEE Electron Devices Society,WaSeSSWaSeSSPROCEEDING9910131305003321ICMTS 20152530463UNINA