01858nam 2200421 a 450 991070115600332120111103133114.0(CKB)5470000002415487(OCoLC)759511225(EXLCZ)99547000000241548720111103h19811981 aa 0engurmn|||||||||txtrdacontentcrdamediacrrdacarrierNapi's journey[electronic resource] /developed by the Blackfeet Indians ; written by Carmen Marceau ... [and others]. ; illustrated by Melvin Tailfeathers[Washington, D.C.] :[National Institute of Education],[1981]©19811 online resource (51 pages) illustrationsThe Indian reading series : stories and legends of the Northwest ;level 4, bk. 17Title from PDF title screen (viewed Oct. 20, 2011)."Developed by the Pacific Northwest Indian Reading and Language Development Program, Northwest Regional Educational Laboratory"--T.p. verso."Performed pursuant to contract no. 400-80-0105 with the Educational Equity Group/Multicultural/Bilingual Division of the National Institute of Education"--T.p. verso.Siksika IndiansFolkloreJuvenile literatureIndians of North AmericaFolkloreJuvenile literatureSiksika IndiansIndians of North AmericaMarceau Carmen1389729Tailfeathers Melvin1386278Pacific Northwest Indian Reading and Language Development Program.National Institute of Education (U.S.).Educational Equity Group.GPOGPOBOOK9910701156003321Napi's journey3441668UNINA01469oam 2200445zu 450 991013065380332120241212220405.097814673098371467309834(CKB)3420000000000524(SSID)ssj0000823839(PQKBManifestationID)12427814(PQKBTitleCode)TC0000823839(PQKBWorkID)10787168(PQKB)10550564(NjHacI)993420000000000524(EXLCZ)99342000000000052420160829d2012 uy engur|||||||||||txtccr2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits[Place of publication not identified]IEEE20121 online resource (408 pages)Bibliographic Level Mode of Issuance: Monograph9781467309806 146730980X Integrated circuitsDefectsCongressesIntegrated circuitsDesign and constructionCongressesIntegrated circuitsDefectsIntegrated circuitsDesign and construction621.3815IEEE StaffPQKBPROCEEDING99101306538033212012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits2495790UNINA