01414oam 2200421zu 450 991013065380332120210807004601.01-4673-0983-4(CKB)3420000000000524(SSID)ssj0000823839(PQKBManifestationID)12427814(PQKBTitleCode)TC0000823839(PQKBWorkID)10787168(PQKB)10550564(NjHacI)993420000000000524(EXLCZ)99342000000000052420160829d2012 uy engur|||||||||||txtccr2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits[Place of publication not identified]IEEE20121 online resource (408 pages)Bibliographic Level Mode of Issuance: Monograph1-4673-0980-X Integrated circuitsDefectsCongressesIntegrated circuitsDesign and constructionCongressesIntegrated circuitsDefectsIntegrated circuitsDesign and construction621.3815IEEE StaffPQKBPROCEEDING99101306538033212012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits2495790UNINA