00965nam0-2200301---450-99000975043040332120130710102819.0978-0-470-51851-9000975043FED01000975043(Aleph)000975043FED0100097504320130710d2011----km-y0itay50------baenga-------001yyAberration-Corrected Analytical Transmission Electron MicroscopyEdited by Rik BrydsonChichesterWIleyc2011XV, 280 p.ill.24 cmPublished in association with the Royal Microscopical SocietyTransmission Electron MicroscopyAberrationBrydson,RikITUNINARICAUNIMARCBK99000975043040332104 044-194DICDINCHDINCHAberration-Corrected Analytical Transmission Electron Microscopy833985UNINA01390nam0 2200313 i 450 SUN002712520180426121555.163978-03-87940-55-70.0020041103d1994 |0engc50 baengUS|||| |||||*Measure theoryJoseph Leo DoobNew YorkSpringer1994XII, 210 p.24 cm.001SUN00235792001 *Graduate texts in mathematics143210 New YorkSpringer1950-.28-XXMeasure and integration [MSC 2020]MFSUNC01987860-XXProbability theory and stochastic processes [MSC 2020]MFSUNC020428USNew YorkSUNL000011515Analisi matematica22Doob, Joseph LeoSUNV02259826308SpringerSUNV000178650ITSOL20200921RICA/sebina/repository/catalogazione/documenti/Doob - Measure theory.pdfContentsSUN0027125UFFICIO DI BIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA08PREST 28-XX 1174 08 2603 I 20061116 UFFICIO DI BIBLIOTECA DEL DIPARTIMENTO DI ECONOMIA03PREST VAc30 03 32298 20160421 Measure theory376469UNICAMPANIA