01107nam0-22003491i-450-99000813067040332120050615113414.03-540-43439-9000813067FED01000813067(Aleph)000813067FED0100081306720050615d2003----km-y0itay50------baengDE--------001yyLock-in thermographybasics and use for functional diagnostics of electronic componentsO. Breitenstein, M. LangenkampBerlinSpringer2003VIII, 193 p.ill.24 cmSpringer series in advanced microelectronics1437-038710Strumenti elettronici - Proprietà termicheTermografia621.3815'48Breitenstein,Otwin<1953- >422827Langenkamp,Martin<1964- >286871ITUNINARICAUNIMARCBK99000813067040332110 E I 412DIET 2195DINELDINELLock-in thermography755784UNINA