00874nam0-22003251i-450-99000786712040332120100723095427.088-8091-300-X000786712FED01000786712(Aleph)000786712FED0100078671220040408d1990----km-y0itay50------baitaITy---a---001yyCompendio di archivisticaGiuseppe PlessiBolognaCLUEB1990189 p.22 cmArchivisticaManuali02021ita025.1721itaPlessi,Giuseppe<1917-1990>152995ITUNINARICAUNIMARCBK990007867120403321020 PLE 1Bibl. 43372FLFBCFLFBCCompendio di archivistica133764UNINA01291oam 2200421zu 450 991013960480332120241212215829.0(CKB)2550000000042218(SSID)ssj0000669942(PQKBManifestationID)12330262(PQKBTitleCode)TC0000669942(PQKBWorkID)10715837(PQKB)10278455(NjHacI)992550000000042218(EXLCZ)99255000000004221820160829d2010 uy engur|||||||||||txtccr2010 11th International Workshop on Microprocessor Test and Verification[Place of publication not identified]IEEE20101 online resource (xii, 77 pages)Bibliographic Level Mode of Issuance: Monograph9780769543543 0769543545 9781612842875 1612842879 Integrated circuitsTestingCongressesIntegrated circuitsTesting621.381548IEEE StaffPQKBPROCEEDING99101396048033212010 11th International Workshop on Microprocessor Test and Verification2307208UNINA