00765nam0-22002891i-450-990003018290403321000301829FED01000301829(Aleph)000301829FED0100030182920000920d1979----km-y0itay50------baengITBest Test DesignRasch MeasurementBenjamin D.Wright, Mark H.Stone.ChicagoMesa Press1979.XVI, 222 p.27 cm11360Stone,Mark H.Wright,Benjamin DrakeITUNINARICAUNIMARCBK99000301829040332111360 WRI7422SESSESBest Test Design467473UNINAING01