00870nam0-22002771i-450-99000146440040332120050520120630.0000146440FED01000146440(Aleph)000146440FED0100014644020010214d1986----km-y0itay50------baengUSa---a---001yyAdvanced scanning electron microscopy and X-ray microanalysisDale E. Newbury, David C. Joy, Patrik Echlin, Charles E. Fiori and Joseph I. GoldesteinNew YorkPlenum Press1986Microscopia elettronicaNewbury,Dale E.ITUNINARICAUNIMARCBK9900014644004033219 V 3280DBVDBVAdvanced scanning electron microscopy and X-ray microanalysis379362UNINA