00987nam0-22003131i-450-9900014477404033210-521-55490-X000144774FED01000144774(Aleph)000144774FED0100014477420000920d2000----km-y0itay50------baengCharacterization of high Tc materials and devices by electron microscopyedited by Nigel D. Browning, Stephen J. PennycookCambridgeCambridge University Pressc2000xii, 391 p.ill.26 cmSuperconduttivitàFluidi quantici537.623Browning,Nigel D.Pennycook,Stephen J.ITUNINARICAUNIMARCBK99000144774040332132A-093D.S.F. 6818FI1FI1Characterization of high Tc materials and devices by electron microscopy374367UNINAING01