00978nam0-22003131i-450-9900011190404033210-306-44901-3000111904FED01000111904(Aleph)000111904FED0100011190420000920d1994----km-y0itay50------baengAdvances in X-Ray AnalysisProceedings of the 42 Annual Conference of Applications of X-Ray Analysis, held August 2-6, 1993, in Denver, Coloradoedited by John V. Gilfrich ... [et al.]New YorkPlenum Press1994xxi, 756 p.25 cmAdvances in X-Ray Analysis37CristallografiaRaggi x548Gilfrich,John V.52064ITUNINARICAUNIMARCBK99000111904040332137-025.03719676FI1FI1Advances in X-Ray Analysis336786UNINAING01