00742nam0-22002891i-450-990001085910403321000108591FED01000108591(Aleph)000108591FED0100010859120000920d1964----km-y0itay50------baengOptical Methods of AnalysisE.J. MeehanNew YorkInterscience1964OtticaOttica elettronica535537.56Meehan,Edward J.16756ITUNINARICAUNIMARCBK99000108591040332127-12015762FI1FI1Optical Methods of Analysis335615UNINAING01